Date

Thursday 21 Aug 2025

Time

14:00 - 14:30

Location

BW018

Supervisor

Jörg Meyer

Jury

Rik Mom

Atomic force microscopy (AFM) has evolved into a quantitative, operando probe for electrochemical interfaces by integrating rigorous force calibration with a diverse set of imaging techniques. After reviewing calibration protocols (optical lever sensitivity, thermal-noise or hydrodynamic spring-constant determination, and feedback-setpoint conversion to load) we examine how continuum contact models (Hertz, JKR, DMT) and DLVO theory interpret force-distance curves in liquid. We then survey four core AFM modes: contact, tapping (AM), frequency modulation, and PeakForce, and discuss how they are enhanced using high-speed AFM and three-dimensional mapping. Additionally, several multifunctional correlative techniques (KPFM, C-AFM, ESM, sMIM, AFM-SECM) that are based on the core operating modes are discussed. For all modes in this review, we discuss operational principles, advantages, challenges in electrochemical systems, electrostatic or Faradaic cross-talk, and bubble formation, and highlight recent applications, from in-situ solid-electrolyte interphase (SEI) imaging to atomicresolution hydration layering and real-time hydrogen nanobubble nucleation. By linking experimental observables to mechanical, electrostatic, and ionic properties, this review provides an overview of modern AFM approaches, tailored to specific electrochemical systems.